Ginestra version 1.2
MDLab s.r.l. delivers release 1.2 of the Ginestra™ simulation framework. MDLab today announces the availability of a new Ginestra™ release that further extends the simulation capabilities of the Company’s flagship software solution dedicated to the modeling and interpretation of the electrical characteristics of devices based on new materials such as transition metal oxides, chalcogenides and semiconductors over and above traditional silicon.
IMPROVE THE DEVICE AND MATERIAL RELIABILITY
REDUCE THE TIME-TO-MARKET and TECHNOLOGY DEVELOPMENT COSTS
OPTIMIZE A NOVEL CLASS OF DEVICES WITH MIXED ELECTRONIC/ IONIC TRASPORT
ENABLE THE AUTOMATIC PRODUCT AND MATERIAL QUALITY MONITORING, THE DEFECT SPECTROSCOPY AND ROOT CAUSE ANALISYS